IT Product Testing
We evaluate the reliability of IT/electronic products and automotive-grade semiconductors and components in accordance with domestic and international standards such as AEC-Q.
- Test Items
- 6
- Standards
- 4
- Equipment
- 5
Service Overview
ATL evaluates and analyzes whether IT products such as smartphones, smartwatches, laptops, tablets, and lighting operate reliably across diverse environments, in accordance with domestic and international standards.
In particular, we verify the quality and reliability of automotive-grade semiconductors (ICs, discretes, optoelectronics, MEMS, MCM) and passive components under the AEC-Q series established by the U.S. Automotive Electronics Council (AEC).
Through stress testing under extreme conditions such as temperature, vibration, and humidity, we support minimizing failure rates (Zero Defect) and strengthening quality competitiveness for global component supply.
Key Test Items
Core testing and evaluation items specific to this field.
Applicable Standards
Delivering objective test results based on international and domestic standards.
- AEC-Q100 / Q101
- Stress test qualification specification for automotive-grade integrated circuits (ICs) and discrete semiconductors
- AEC-Q102 / Q103
- Stress test qualification specification for optoelectronic devices (LEDs, etc.) and MEMS devices
- AEC-Q104
- Stress test qualification specification for multi-chip modules (MCM, SiP)
- AEC-Q200
- Stress test qualification specification for passive components (resistors, capacitors, inductors)
Equipment
Precision-calibrated test facilities that produce accurate, reliable data.
Thermal Shock Chamber
-65 to 200°C, damper type
Performs AEC-Q temperature stress (thermal shock) testing.
Rapid Temperature Change Chamber (PTC)
-65 to 200°C, 7/10/15°C/min
Performs powered temperature cycling stress testing.
Constant Temperature & Humidity Chamber
-60 to 150°C, 20–98%RH
Performs environmental stress testing such as high temperature and humidity.
Combined Vibration Test System
Max. 63.6kN, 2–2,700Hz
Performs mechanical vibration stress testing.
Scanning Electron Microscope (SEM/EDS)
Magnification 30–250,000x, 5nm
Performs device failure analysis and microstructure/composition analysis.
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ATL's expert engineers provide reliability testing for automotive electronics, defense, and IT products. Request a quote online or call us.